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JSM-IT300型扫描电子显微镜

作者:        发布于:2018-05-23
测试中心册子11.30_页面_08_图像_0002.jpg
 
 
型号:JSM-IT300
 

生产国别厂家:日本电子株式会社

 

主要技术指标:二次电子像分辨率:3.0nm 背散射电子像分辨率:4.0nm

 

放大倍数范围X5X300000

 

加速电压:0.3kV30kV

 

图像种类:二次电子像、背散射电子像

 

仪器简介:扫描电子显微镜是利用电子枪射出的高能电子束,在试样表面作行帧扫描,激发出各种物理信号,这些信号的强度取决于试样表面的形貌、成分和晶体取向等特征。信号经过放大处理后由显示器给出反映试样表面特征的扫描电子图像,JSM-IT300扫描电子显微镜主要用于试样表面的分析与观察,已经成为材料学、生命科学和产业部门质量控制中不可缺少的工具。

 

X射线能谱分析系统(能谱仪)

 

型号:Aztec Energy Standard X-MaxN20

 

生产国别厂家:牛津公司

 

分辨率:优于127eV

 

元素探测范围:Be4–U92

 

主要用途:元素的定性、定量分析,面分布及图像处理,牛津能谱仪是具有图像及成分图的能谱分析系统,具有分辨率高和定性、定量准确等特点。

 

  

Model: JSM-IT300

Manufacturer: JEOL Ltd.Japan

Main specificationsHV Model Resolution: 3.0nm in SEI 4.0nm in BEI

Magnification: X5X300000

Accelerating voltage: 0.3kV30kV

Scanning electron microscope is imaging technique of revealing the surface topography of a Specimen when a electron beam with a high energy emitted from an electron gun is incident upon the surface by frame frequency scanning. Secondary electrons and back scattered electrons containing all kinds of physical information are excited from the surface. The intensities of secondary electrons and back scattered electrons depend on the surface morphology, element and crystal orientation. When the signals of secondary electrons and back scattered electrons are amplified, the terminal of a computer will display an image of the reflecting surface characteristics of the specimen. Model JSM-IT300 scanning electron microscope is mostly applied in observing the surface topography and it has been an important implement in materials science, biological science and all industrial departments. JSM-IT300 scanning electron microscope can be used for nonconductive samples directly, and mining industry. Biological samples, such as tissue fat,flower powder and rhizome, etc., can be observed directly after special and simple preparation.

EDS is used on JSM-IT300 as its accessory

Model: Aztec Energy Standard X-MaxN20

Manufacturer: Oxford Instruments

Main specificationsResolution:127eV

Element probing range: Be4–U92.

Main applications:Quantitaive and qualitative analysis of elements, particle analysis, phase distribution and image handling.

Phoenix EDS provides an image and composition graph with a best resolution and high accuracy.

 

 

 

 

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